research-article

Write or not: programming scheme optimization for RRAM-based neuromorphic computing

Authors:

Weikang QianAuthors Info & Claims

DAC '22: Proceedings of the 59th ACM/IEEE Design Automation Conference

Pages 985 - 990

https://doi.org/10.1145/3489517.3530558

Published: 23 August 2022 Publication History

Abstract

One main fault-tolerant method for a neural network accelerator based on resistive random access memory crossbars is the programming-based method, which is also known as write-and-verify (W-V). In the basic W-V scheme, all devices in crossbars are programmed repeatedly until they are close enough to their targets, which costs huge overhead. To reduce the cost, we optimize the W-V scheme by proposing a probabilistic termination criterion on a single device and a systematic optimization method on multiple devices. Furthermore, we propose a joint algorithm that assists the novel W-V scheme by incremental retraining, which further reduces the W-V cost. Compared to the basic W-V scheme, our proposed method improves the accuracy by 0.23% for ResNet18 on CIFAR10 with only 9.7% W-V cost under variation with σ = 1.2.

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Cited By

He WMeng JGonugondla SYu SShanbhag NSeo J(2023)PRIVE: Efficient RRAM Programming with Chip Verification for RRAM-based In-Memory Computing Acceleration2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)10.23919/DATE56975.2023.10137266(1-6)Online publication date: Apr-2023
https://doi.org/10.23919/DATE56975.2023.10137266
Sun YWang DXu LChen YLi ZLiu SHe WLiu YYang HLi X(2023)CREAM: Computing in ReRAM-Assisted Energy- and Area-Efficient SRAM for Reliable Neural Network AccelerationIEEE Transactions on Circuits and Systems I: Regular Papers10.1109/TCSI.2023.327287470:8(3198-3211)Online publication date: Aug-2023
https://doi.org/10.1109/TCSI.2023.3272874
Zhao SLiu BWang FFeng DChen X(2023)TOSA: Tolerating Stuck-At-Faults in Edge-based RRAM Inference Accelerators2023 IEEE 29th International Conference on Parallel and Distributed Systems (ICPADS)10.1109/ICPADS60453.2023.00172(1181-1190)Online publication date: 17-Dec-2023
https://doi.org/10.1109/ICPADS60453.2023.00172
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cover image ACM Conferences

DAC '22: Proceedings of the 59th ACM/IEEE Design Automation Conference

July 2022

1462 pages

ISBN:9781450391429

DOI:10.1145/3489517

General Chair:
Rob Oshana
NXP

Copyright © 2022 ACM.

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SIGDA: ACM Special Interest Group on Design Automation
IEEE CEDA

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Association for Computing Machinery

New York, NY, United States

Publication History

Published: 23 August 2022

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Funding Sources

Science and Technology Commission of Shanghai Municipality
National Key R&D Program of China
National Natural Science Foundation of China

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DAC '22

Sponsor:

SIGDA

DAC '22: 59th ACM/IEEE Design Automation Conference

July 10 - 14, 2022

California, San Francisco

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Overall Acceptance Rate 1,770 of 5,499 submissions, 32%

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DAC '25

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62nd ACM/IEEE Design Automation Conference

June 22 - 26, 2025

San Francisco , CA , USA

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Cited By

He WMeng JGonugondla SYu SShanbhag NSeo J(2023)PRIVE: Efficient RRAM Programming with Chip Verification for RRAM-based In-Memory Computing Acceleration2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)10.23919/DATE56975.2023.10137266(1-6)Online publication date: Apr-2023
https://doi.org/10.23919/DATE56975.2023.10137266
Sun YWang DXu LChen YLi ZLiu SHe WLiu YYang HLi X(2023)CREAM: Computing in ReRAM-Assisted Energy- and Area-Efficient SRAM for Reliable Neural Network AccelerationIEEE Transactions on Circuits and Systems I: Regular Papers10.1109/TCSI.2023.327287470:8(3198-3211)Online publication date: Aug-2023
https://doi.org/10.1109/TCSI.2023.3272874
Zhao SLiu BWang FFeng DChen X(2023)TOSA: Tolerating Stuck-At-Faults in Edge-based RRAM Inference Accelerators2023 IEEE 29th International Conference on Parallel and Distributed Systems (ICPADS)10.1109/ICPADS60453.2023.00172(1181-1190)Online publication date: 17-Dec-2023
https://doi.org/10.1109/ICPADS60453.2023.00172
Wang DXu LLiu SLi ZChen YHe WLi XSun Y(2023)TL-nvSRAM-CIM: Ultra-High-Density Three-Level ReRAM-Assisted Computing-in-nvSRAM with DC-Power Free Restore and Ternary MAC Operations2023 IEEE/ACM International Conference on Computer Aided Design (ICCAD)10.1109/ICCAD57390.2023.10323889(1-9)Online publication date: 28-Oct-2023
https://doi.org/10.1109/ICCAD57390.2023.10323889

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