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A2-ILT: GPU accelerated ILT with spatial attention mechanism

Published: 23 August 2022 Publication History

Abstract

Inverse lithography technology (ILT) is one of the promising resolution enhancement techniques (RETs) in modern design-for-manufacturing closure, however, it suffers from huge computational overhead and unaffordable mask writing time. In this paper, we propose A2-ILT, a GPU-accelerated ILT framework with spatial attention mechanism. Based on the previous GPU-accelerated ILT flow, we significantly improve the ILT quality by introducing spatial attention map and on-the-fly mask rectilinearization, and strengthen the robustness by Reinforcement-Learning deployment. Experimental results show that, comparing to the state-of-the-art solutions, A2-ILT achieves 5.06% and 11.60% reduction in printing error and process variation band with a lower mask complexity and superior runtime performance.

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cover image ACM Conferences
DAC '22: Proceedings of the 59th ACM/IEEE Design Automation Conference
July 2022
1462 pages
ISBN:9781450391429
DOI:10.1145/3489517
Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Published: 23 August 2022

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DAC '22: 59th ACM/IEEE Design Automation Conference
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Cited By

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  • (2024)CAMO: Correlation-Aware Mask Optimization with Modulated Reinforcement LearningProceedings of the 61st ACM/IEEE Design Automation Conference10.1145/3649329.3656254(1-6)Online publication date: 23-Jun-2024
  • (2024)Fracturing-aware Curvilinear ILT via Circular E-beam Mask WriterProceedings of the 61st ACM/IEEE Design Automation Conference10.1145/3649329.3655926(1-6)Online publication date: 23-Jun-2024
  • (2024)EMOGen: Enhancing Mask Optimization via Pattern GenerationProceedings of the 61st ACM/IEEE Design Automation Conference10.1145/3649329.3655680(1-6)Online publication date: 23-Jun-2024
  • (2024)SwinT-ILT: Swin Transformer embedding end-to-end mask optimization modelJournal of Micro/Nanopatterning, Materials, and Metrology10.1117/1.JMM.23.1.01320123:01Online publication date: 1-Jan-2024
  • (2024)Ultrafast Source Mask Optimization via Conditional Discrete DiffusionIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2024.336140043:7(2140-2150)Online publication date: Jul-2024
  • (2024)A Review of DNN and GPU in Optical Proximity Correction2024 2nd International Symposium of Electronics Design Automation (ISEDA)10.1109/ISEDA62518.2024.10617556(703-709)Online publication date: 10-May-2024
  • (2024)A Novel Optical Proximity Correction Machine Learning Model Using a Single-Flow Convolutional Feedback Networks With Customized AttentionIEEE Access10.1109/ACCESS.2024.349481612(165979-165991)Online publication date: 2024
  • (2023)LithoBenchProceedings of the 37th International Conference on Neural Information Processing Systems10.5555/3666122.3667437(30243-30254)Online publication date: 10-Dec-2023
  • (2023)Enabling Scalable AI Computational Lithography with Physics-Inspired ModelsProceedings of the 28th Asia and South Pacific Design Automation Conference10.1145/3566097.3568361(715-720)Online publication date: 16-Jan-2023
  • (2023)L2O-ILT: Learning to Optimize Inverse Lithography TechniquesIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2023.332316443:3(944-955)Online publication date: 10-Oct-2023
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