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PPATuner: pareto-driven tool parameter auto-tuning in physical design via gaussian process transfer learning

Published: 23 August 2022 Publication History

Abstract

Thanks to the amazing semiconductor scaling, incredible design complexity makes the synthesis-centric very large-scale integration (VLSI) design flow increasingly rely on electronic design automation (EDA) tools. However, invoking EDA tools especially the physical synthesis tool may require several hours or even days for only one possible parameters combination. Even worse, for a new design, oceans of attempts to navigate high quality-of-results (QoR) after physical synthesis have to be made via multiple tool runs with numerous combinations of tunable tool parameters. Additionally, designers often puzzle over simultaneously considering multiple QoR metrics of interest (e.g., delay, power, and area). To tackle the dilemma within finite resource budget, designing a multi-objective parameter auto-tuning framework of the physical design tool which can learn from historical tool configurations and transfer the associated knowledge to new tasks is in demand. In this paper, we propose PPATuner, a Pareto-driven physical design tool parameter tuning methodology, to achieve a good trade-off among multiple QoR metrics of interest (e.g., power, area, delay) at the physical design stage. By incorporating the transfer Gaussian process (GP) model, it can autonomously learn the transfer knowledge from the existing tool parameter combinations. The experimental results on industrial benchmarks under the 7nm technology node demonstrate the merits of our framework.

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Cited By

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  • (2024)Attention-Based EDA Tool Parameter Explorer: From Hybrid Parameters to Multi-QoR metrics2024 Design, Automation & Test in Europe Conference & Exhibition (DATE)10.23919/DATE58400.2024.10546562(1-6)Online publication date: 25-Mar-2024
  • (2023)Progress of Placement Optimization for Accelerating VLSI Physical DesignElectronics10.3390/electronics1202033712:2(337)Online publication date: 9-Jan-2023
  • (2023)Microarchitecture Design Space Exploration via Pareto-Driven Active LearningIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2023.331162031:11(1727-1739)Online publication date: 19-Sep-2023
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cover image ACM Conferences
DAC '22: Proceedings of the 59th ACM/IEEE Design Automation Conference
July 2022
1462 pages
ISBN:9781450391429
DOI:10.1145/3489517
Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Published: 23 August 2022

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  • The Research Grants Council of Hong Kong SAR

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DAC '22: 59th ACM/IEEE Design Automation Conference
July 10 - 14, 2022
California, San Francisco

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View all
  • (2024)Attention-Based EDA Tool Parameter Explorer: From Hybrid Parameters to Multi-QoR metrics2024 Design, Automation & Test in Europe Conference & Exhibition (DATE)10.23919/DATE58400.2024.10546562(1-6)Online publication date: 25-Mar-2024
  • (2023)Progress of Placement Optimization for Accelerating VLSI Physical DesignElectronics10.3390/electronics1202033712:2(337)Online publication date: 9-Jan-2023
  • (2023)Microarchitecture Design Space Exploration via Pareto-Driven Active LearningIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2023.331162031:11(1727-1739)Online publication date: 19-Sep-2023
  • (2023)CircuitNet: An Open-Source Dataset for Machine Learning in VLSI CAD Applications With Improved Domain-Specific Evaluation Metric and Learning StrategiesIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2023.328797042:12(5034-5047)Online publication date: 20-Jun-2023
  • (2023)Multi-Source Transfer Learning for Design Technology Co-Optimization2023 IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED)10.1109/ISLPED58423.2023.10244484(1-6)Online publication date: 7-Aug-2023
  • (2022)FAST-Based Production Monitoring Information System for Extra-High Voltage Power Line Towers2022 IEEE Creative Communication and Innovative Technology (ICCIT)10.1109/ICCIT55355.2022.10118630(1-8)Online publication date: 22-Nov-2022

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