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Reliable Computing of ReRAM Based Compute-in-Memory Circuits for AI Edge Devices

Authors:

Meng-Fan Chang,

Ping-Cheng Chen,

Tai-Hao WenAuthors Info & Claims

ICCAD '22: Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design

Article No.: 158, Pages 1 - 6

https://doi.org/10.1145/3508352.3561119

Published: 22 December 2022 Publication History

Abstract

Compute-in-memory macros based on non-volatile memory (nvCIM) are a promising approach to break through the memory bottleneck for artificial intelligence (AI) edge devices; however, the development of these devices involves unavoidable tradeoffs between reliability, energy efficiency, computing latency, and readout accuracy. This paper outlines the background of ReRAM-based nvCIM as well as the major challenges in its further development, including process variation in ReRAM devices and transistors and the small signal margins associated with variation in input-weight patterns. This paper also investigates the error model of a nvCIM macro, and the correspondent degradation of inference accuracy as a function of error model when using nvCIM macros. Finally, we summarize recent trends and advances in the development of reliable ReRAM-based nvCIM macro.

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Cited By

YAMADA AHUANG ZMISAWA NMATSUI CTAKEUCHI K(2024)Comprehensive Analysis of Read Fluctuations in ReRAM CiM by Using Fluctuation Pattern ClassifierIEICE Transactions on Electronics10.1587/transele.2023CTP0002E107.C:10(416-425)Online publication date: 1-Oct-2024
https://doi.org/10.1587/transele.2023CTP0002

Index Terms

Reliable Computing of ReRAM Based Compute-in-Memory Circuits for AI Edge Devices
1. Computer systems organization
  1. Dependable and fault-tolerant systems and networks
    1. Processors and memory architectures
2. Hardware

Index terms have been assigned to the content through auto-classification.

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cover image ACM Conferences

ICCAD '22: Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design

October 2022

1467 pages

ISBN:9781450392174

DOI:10.1145/3508352

Conference Chair:
Tulika Mitra
National University of Singapore
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Program Chairs:
Evangeline Young
The Chinese University of Hong Kong
,
Jinjun Xiong
University at Buffalo (UB)

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Published: 22 December 2022

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Cited By

YAMADA AHUANG ZMISAWA NMATSUI CTAKEUCHI K(2024)Comprehensive Analysis of Read Fluctuations in ReRAM CiM by Using Fluctuation Pattern ClassifierIEICE Transactions on Electronics10.1587/transele.2023CTP0002E107.C:10(416-425)Online publication date: 1-Oct-2024
https://doi.org/10.1587/transele.2023CTP0002

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