skip to main content
10.1145/3531232.3531241acmotherconferencesArticle/Chapter ViewAbstractPublication PagesivspConference Proceedingsconference-collections
research-article

Defect Recognition of Printed Circuit Board Based on YOLOv3-DenseNet Optimization Model

Published: 01 June 2022 Publication History

Abstract

Accurate detection of fabrication defects of printed circuit boards (PCB) is essential for quality control of electronic products. However, due to the small feature size of PCB defects, the existing target recognition algorithms still show difficulty in processing defect detection of PCBs with complex circuit layouts. In response to this problem, we propose a novel YOLOv3-DenseNet for defect detection of PCBs. The YOLOv3-DenseNet is based on YOLOv3 with key improvements: firstly, the residual units in YOLOv3 are partially replaced by dense blocks to enhance the feature reuse of the networks; secondly, the loss function is revised by adopting the generalized intersection over union (GIOU) between the predicted box and the ground truth, to tackle the termination of optimization process when IOU is zero. Result comparison shows that the proposed YOLOv3-DenseNetoutperforms other commonly used YOLOv3 family models in term of recognition accuracy, while the model size is even smaller.

References

[1]
Hou Q, Sun J, Huang P. A novel algorithm for tool wear online inspection based on machine vision[J]. International Journal of Advanced Manufacturing Technology, 2019, 101(9–10).
[2]
Putera S, Ibrahim Z. Printed circuit board defect detection using mathematical morphology and MATLAB image processing tools[C]// International Conference on Education Technology & Computer. IEEE, 2010.
[3]
Deng Y S, Luo A C, Dai M J. Building an Automatic Defect Verification System Using Deep Neural Network for PCB Defect Classification[C]// 2018 4th International Conference on Frontiers of Signal Processing (ICFSP). 2018.
[4]
P. S. M, S. N R. PCB Defect Detection, Classification and Localization using Mathematical Morphology and Image Processing Tools[J]. International Journal of Computer Applications, 2014, 87(9):40-45.
[5]
Gaidhane, V., Hote, Y., Singh, V.: ‘An efficient similarity measure approach for pcb surface defect detection’, Pattern Anal. Appl., 2018, 21, (1), pp. 277–289
[6]
Kaur B, Kaur G, Kaur A. Detection and classification of Printed circuit board defects using image subtraction method[C]// 2014 Recent Advances in Engineering and Computational Sciences (RAECS). 2014.
[7]
Annaby M H, Basha S H, Fouda Y M. Defect detection methods using boolean functions and the ϕ -coefficient between bit-plane slices[J]. Optics and Lasers in Engineering, 2020, 139(6):106474.
[8]
Kujawa S, Mazurkiewicz J, Czekaa W. Using convolutional neural networks to classify the maturity of compost based on sewage sludge and rapeseed straw[J]. Journal of Cleaner Production, 2020, 258(6):120814.
[9]
Xiao B, Xu Y, Bi X, Heart Sounds Classification Using a Novel 1-D Convolutional Neural Network with Extremely Low Parameter Consumption[J]. Neurocomputing, 2019.
[10]
Wang H, Zeng Q, Yang L, Cross-Domain Segmentation of Fundus Vessels Based on Feature Space Alignment[C]// 2020 IEEE International Conference on Mechatronics and Automation (ICMA). IEEE, 2020.
[11]
N Zeng, Wang Z, Zhang H, An Improved Particle Filter With a Novel Hybrid Proposal Distribution for Quantitative Analysis of Gold Immunochromatographic Strips[J]. IEEE Transactions on Nanotechnology, 2019, PP (99):1-1.
[12]
Nianyin, Zeng, Zidong, Image-Based Quantitative Analysis of Gold Immunochromatographic Strip via Cellular Neural Network Approach[J]. Medical Imaging, 2014.
[13]
Yang L, Fan J, Liu Y, Automatic Detection and Location of Weld Beads with Deep Convolutional Neural Networks[J]. IEEE Transactions on Instrumentation and Measurement, 2020, PP (99):1-1.
[14]
Rintaro H, James R, Tyler D, Artificial intelligence using convolutional neural networks for real-time detection of early esophageal neoplasia in Barrett's esophagus (with video) [J]. Gastrointestinal endoscopy, 2020.
[15]
Deep Residual Learning for Image Recognition[C]// IEEE Conference on Computer Vision & Pattern Recognition. IEEE Computer Society, 2016.
[16]
Huan Zhang, Liangxiao Jiang, Chaoqun Li, CS-ResNet: Cost-sensitive residual convolutional neural network for PCB cosmetic defect detection, Expert Systems with Applications, 2021, 115673, ISSN 0957-4174.
[17]
R Ding, Dai L, Li G, TDD-Net: A Tiny Defect Detection Network for Printed Circuit Boards[J]. CAAI Transactions on Intelligence Technology, 2019.
[18]
Redmon J, Divvala S, Girshick R, You Only Look Once: Unified, Real-Time Object Detection[J]. IEEE, 2016.
[19]
Redmon J, Farhadi A. YOLO9000: Better, Faster, Stronger[J]. IEEE Conference on Computer Vision & Pattern Recognition, 2017:6517-6525.
[20]
Redmon J, Farhadi A. YOLOv3: An Incremental Improvement[J]. arXiv e-prints, 2018.
[21]
Girshick R, Donahue J, Darrell T, [IEEE 2014 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) - Columbus, OH, USA (2014.6.23-2014.6.28)] 2014 IEEE Conference on Computer Vision and Pattern Recognition - Rich Feature Hierarchies for Accurate Object Detection and Semantic Se[J]. 2014:580-587.
[22]
Xiu L, Min S, Qin H, Fast accurate fish detection and recognition of underwater images with Fast R-CNN[C]// Oceans. IEEE, 2016.
[23]
Girshick R. Fast R-CNN[J]. Computer Science, 2015.
[24]
Faster R-CNN: Towards Real-Time Object Detection with Region Proposal Networks[J]. IEEE Transactions on Pattern Analysis and Machine Intelligence, 2015, 39(6).
[25]
Sun N, Zhu Y, Hu X. Faster R-CNN Based Table Detection Combining Corner Locating[C]// 2019 International Conference on Document Analysis and Recognition (ICDAR). 2019.
[26]
He K, Gkioxari G, P Dollár, Mask R-CNN[J]. IEEE Transactions on Pattern Analysis & Machine Intelligence, 2017.
[27]
Zhida, Huang, Zhuoyao, Mask R-CNN with Pyramid Attention Network for Scene Text Detection[C]// 2019 IEEE Winter Conference on Applications of Computer Vision (WACV). 0.
[28]
Huang G, Liu Z, Laurens V, Densely Connected Convolutional Networks[C]// IEEE Computer Society. IEEE Computer Society, 2016.
[29]
Tian Y, G Y ang, Wang Z, Apple detection during different growth stages in orchards using the improved YOLO-V3 model[J]. Computers and Electronics in Agriculture, 2019, 157:417-426.
[30]
Xu D, Wu Y. Improved YOLO-V3 with DenseNet for Multi-Scale Remote Sensing Target Detection[J]. Sensors, 2020, 20(15):4276.
[31]
H Rezatofighi, Tsoi N, JY Gwak, Generalized Intersection Over Union: A Metric and a Loss for Bounding Box Regression[C]// 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR). IEEE, 2019.

Cited By

View all
  • (2024)Research on a Lightweight PCB Detection Algorithm Based on AE-YOLOIEEE Access10.1109/ACCESS.2024.343952312(109367-109379)Online publication date: 2024
  • (2023)A PCB Defect Detector Based on Coordinate Feature RefinementIEEE Transactions on Instrumentation and Measurement10.1109/TIM.2023.332248372(1-10)Online publication date: 2023

Recommendations

Comments

Information & Contributors

Information

Published In

cover image ACM Other conferences
IVSP '22: Proceedings of the 2022 4th International Conference on Image, Video and Signal Processing
March 2022
237 pages
ISBN:9781450387415
DOI:10.1145/3531232
Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than the author(s) must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected].

Publisher

Association for Computing Machinery

New York, NY, United States

Publication History

Published: 01 June 2022

Permissions

Request permissions for this article.

Check for updates

Author Tags

  1. DenseNet
  2. PCB defects
  3. Tiny target detection
  4. YOLOv3

Qualifiers

  • Research-article
  • Research
  • Refereed limited

Funding Sources

Conference

IVSP 2022

Contributors

Other Metrics

Bibliometrics & Citations

Bibliometrics

Article Metrics

  • Downloads (Last 12 months)9
  • Downloads (Last 6 weeks)0
Reflects downloads up to 05 Mar 2025

Other Metrics

Citations

Cited By

View all
  • (2024)Research on a Lightweight PCB Detection Algorithm Based on AE-YOLOIEEE Access10.1109/ACCESS.2024.343952312(109367-109379)Online publication date: 2024
  • (2023)A PCB Defect Detector Based on Coordinate Feature RefinementIEEE Transactions on Instrumentation and Measurement10.1109/TIM.2023.332248372(1-10)Online publication date: 2023

View Options

Login options

View options

PDF

View or Download as a PDF file.

PDF

eReader

View online with eReader.

eReader

HTML Format

View this article in HTML Format.

HTML Format

Figures

Tables

Media

Share

Share

Share this Publication link

Share on social media