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View all- Chen YTsai Y(2023)Reliability of Computing-In-Memories: Threats, Detection Methods, and Mitigation Approaches2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)10.1109/DFT59622.2023.10313545(1-6)Online publication date: 3-Oct-2023