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Detection on chemical fiber silk detects by deep learning

Published:15 March 2023Publication History

ABSTRACT

There are many surface defects which are difficult to detect manually in the process of chemical fiber silk production. In order to realize the intelligent detection on these defects and improve detection accuracy, an improved Faster RCNN algorithm was proposed. Firstly, the deformable convolution model was added to the backbone feature extraction network to improve the adaptability of the network to different defect features. Secondly, the Feature Pyramid Network was replaced by Recursive Feature Pyramid structure to extract features twice. Finally, the Loss function was improved, and RS Loss function was used to replace the original classification loss function to solve the problem caused by imbalanced sample categories. Experiment result shows that the mAP value calculated by the improved model is 84.7%, which is 4.3% higher than original Faster RCNN model. The improved model can meet the requirements of intelligent detection on chemical fiber silk defects in practical production and processing.

References

  1. M Yao, K Lai, R J Sun. Review and Prospect of Textile Detection Technology and Test Instruments[J]. Cotton Textile Technology, 2003, 31(2): 16-19Google ScholarGoogle Scholar
  2. Z J Duan, S B Li, J J Hu, Review of deep learning based object detection methods and their mainstream frameworks[J]. Laser & Optoelectronics Progress, 2020, 57(12): 59-74.Google ScholarGoogle Scholar
  3. M M Fu, M L Deng, D X Zhang. Survey on deep neural network image target detection algorithms[J]. Computer Systems & Applications, 2022, 31(07): 35-45.Google ScholarGoogle Scholar
  4. J F Dai, H Z Qi, Y W Xiong, Deformable Convolutional Networks[C]//Proceedings of 2017 IEEE International Conference on Computer Vision, October 22-29, 2017, Venice, Italy. New York: IEEE, 2017: 764-773.Google ScholarGoogle Scholar
  5. S Y Qiao, L C Chen, Y Alan. DetectoRS: Detecting Objects with Recursive Feature Pyramid and Switchable Atrous Convolution[C]//2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), June 19-25, 2021. New York: IEEE, 2021: 10208-10219.Google ScholarGoogle Scholar
  6. K Oksuz, B C Cam, E Akbas, Rank & Sort Loss for Object Detection and Instance Segmentation[C]//2021 IEEE/CVF International Conference on Computer Vision (ICCV), June 19-25, 2021. New York: IEEE, 2021: 2989-2998.Google ScholarGoogle ScholarCross RefCross Ref
  7. K He, X Zhang, S Ren, . Deep residual learning for image recognition[C]//2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), June 26-July 1, 2016, Las Vegas, USA. New York: IEEE, 2016: 770-778.Google ScholarGoogle Scholar
  8. T Y Lin, P Dollar, R Girshick, Feature pyramid networks for object detection[C]//2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), July 21-26, 2017, Honolulu, USA. New York: IEEE, 2017: 936-944.Google ScholarGoogle Scholar

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  • Published in

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    EITCE '22: Proceedings of the 2022 6th International Conference on Electronic Information Technology and Computer Engineering
    October 2022
    1999 pages
    ISBN:9781450397148
    DOI:10.1145/3573428

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    Publication History

    • Published: 15 March 2023

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