Bad Block Detection of Spaceborne NAND Flash Based on FPGA

With the rapid development of NAND flash technology, the throughput of data is increasing. At the same time, the requirements for data accuracy are also higher and higher. Bad block is an inherent problem of NAND flash devices. Some early manufacturers also tried to completely eliminate the influence of bad block. However, in practice, it is found that the yield of eliminating bad blocks is very low and the cost is also very high. Therefore, major manufacturers have abandoned this effort. At present, there are several methods for multi-purpose bad block management: hard copy, skip bad blocks, replace the reserved block area of the table, BBT (bad block table) [1]. This paper presents a design method of bad block detection and recording based on NAND flash. With the help of vivado tool of Xilinx company, the bad block detection and management of NAND flash are finally realized through the method of circular writing and reading after erasing. The main modules of this design include general control module, FLASH read data module, flash write data module, flash initialization module Flash erase module, etc.