ABSTRACT
With the advancements in 2.5/3D fabrication offered by Foundry Technologies for unleashing computing power, EDA tools must adapt and take a direction to be more integrated and IC centric for multi-chiplet system design. 3D stacking introduces extra design and analysis requirements like full system planning, power, thermal analysis, cross-die STA and inter-die physical verification which have to be taken into account early during planning and implementation. In this paper, Cadence presents its technology that proactively looks ahead through integrated early analysis and addresses all aspects of 3D-IC design comprehensively from system planning, implementation, analysis and system level signoff capabilities.
- TSMC 3DFabric https://3dfabric.tsmc.com/english/dedicatedFoundry/technology/3DFabric.htm#techGoogle Scholar
- Samsung Foundry - Advanced Package https://semiconductor.samsung.com/foundry/advanced-package/Google Scholar
- Intel Foundry -- Chiplets https://www.intel.com/content/www/us/en/foundry/chiplets.htmlGoogle Scholar
- Cadence 3D-IC Design Solution https://www.cadence.com/en_US/home/solutions/3dic-design-solutions.htmlGoogle Scholar
- 3Dblox Standard https://3dblox.org/Google Scholar
- TSMC EDA Alliance --3DFabric EDA Tool Certification https://www.tsmc.com/english/dedicatedFoundry/oip/eda_allianceGoogle Scholar
Index Terms
- Unified 3D-IC Multi-Chiplet System Design Solution
Recommendations
SkyBridge 2.0: A Fine-grained Vertical 3D-IC Technology for Future ICs
Gate-all-around field effect transistors (FETs) are set to replace FinFETs to enable continued miniaturization of ICs in the deep nanometer regime. IMEC and IRDS roadmaps project that 3D integration of gate-all-around FETs is a key path for the IC ...
AI for EDA/Physical Design: Driving the AI Revolution: The Crucial Role of 3D-IC
ISPD '24: Proceedings of the 2024 International Symposium on Physical Design3D Integrated Circuits (3D-ICs) represent a significant advancement in semiconductor technology, offering enhanced functionality in smaller form factors, improved performance, and cost reductions. These 3D-ICs, particularly those utilizing Through-...
An integrated algorithm for 3D-IC TSV assignment
DAC '11: Proceedings of the 48th Design Automation ConferenceThrough-Silicon Via (TSV) is a technology that enables vertical integration of silicon dies forming a single 3D-IC stack. In this paper, a practical model is proposed for the TSV assignment problem of the stacked-die 3D nets. We present the first work ...
Comments