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Failure Mode Analysis and Infrared Image Recognition of Crystalline Silicon PV Module

Published: 22 May 2024 Publication History

Abstract

In this paper, the fault analysis of crystalline silicon photovoltaic modules is studied. The Failure Mode and Effect Analysis (FMEA) and Fault Tree Analysis (FTA) methods are used to analyze the failure mode and its causes. Based on the results of fault analysis, the infrared image analysis and recognition methods are studied for the two fault modes of infrared hot spot and component shedding of Photovoltaic(PV) modules. The YOLOv5s image recognition method based on clustering improvement and feature enhancement is discussed. The experimental results show that the YOLOv5s image recognition algorithm with clustering improvement and feature enhancement improves the training effect of the model by using the EIOU loss function to adaptively adjust the confidence loss balance coefficient, and the detection speed (Frame Per Second, FPS) can reach 42.37 FPS; by adding InRe feature enhancement modules before each detection layer, the extraction ability of target features is improved. The mean Average Precision (mAP) of hot spot and component shedding are 94.85 % and 90.67 %, respectively, which can fully meet the needs of UAV automatic inspection.

References

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Wei Shuoquan,2020. Intelligent hot spot detection of photovoltaic modules based on infrared images [ D ]. Zhejiang University, .DOI : 10.27461 / d.cnki.gzjdx.2020.000766.
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  1. Failure Mode Analysis and Infrared Image Recognition of Crystalline Silicon PV Module

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    VSIP '23: Proceedings of the 2023 5th International Conference on Video, Signal and Image Processing
    November 2023
    237 pages
    ISBN:9798400709272
    DOI:10.1145/3638682
    Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than the author(s) must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected].

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    Publication History

    Published: 22 May 2024

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    Author Tags

    1. FMEA
    2. FTA
    3. Image recognition
    4. Infrared image
    5. PV module

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