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Miniature Digital Capacitance Inductance Parameter Detection Device

Published: 07 March 2024 Publication History

Abstract

This system is a new device for measuring inductance and capacitance parameters. magnification factor meter on the market are generally expensive and large. This device aims to provide a high-precision measurement tool for electronic circuit design, maintenance and troubleshooting. By applying the alternating voltage signal and measuring the response, the device can accurately measure the values of inductance and capacitance elements by using the method of digital phase detection. This device adopts some common capacitance inductance measurement methods including LCR AC bridge and the like. Measurement of electronic components involves applying an alternating voltage signal to the electronic component to be tested and measuring the current generated by it. By measuring the phase difference between the current and the applied voltage, the impedance can be calculated. After that, the capacitive reactance, D value or inductive reactance and Q value of inductance are obtained by using the method of digital phase detection. The capacitance and inductance are measured at will and the design mode is switched.

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  1. Miniature Digital Capacitance Inductance Parameter Detection Device

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    ICNCC '23: Proceedings of the 2023 12th International Conference on Networks, Communication and Computing
    December 2023
    310 pages
    ISBN:9798400709265
    DOI:10.1145/3638837
    Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than the author(s) must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected].

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    Association for Computing Machinery

    New York, NY, United States

    Publication History

    Published: 07 March 2024

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    Author Tags

    1. Digital phase detection
    2. ESR
    3. Instrumentation amplifier
    4. Parameter measurement of electronic components

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