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Automatic Positioning System for Industrial CT Image Defects Based on Machine Vision

Published:03 May 2024Publication History

ABSTRACT

How to solve the low recall rate and poor positioning accuracy in current CT image defect positioning methods is a thorny problem. Therefore, this study proposes an automatic positioning system for industrial CT image defects based on machine vision. This article uses image preprocessing and scale-invariant feature transformation to process the image, uses a defect location algorithm to locate defects in CT images, and uses threshold segmentation and morphological operations to extract defect areas, and at the same time, designs experiments to compare and evaluate the positioning results with manual annotations, verifying the effectiveness and accuracy of the system. After experimental testing, the positioning accuracy of this system is between 0.01-0.1. The automatic industrial CT image defect positioning system based on machine vision can quickly and accurately locate different types of defects. Compared with traditional manual intervention methods, the system has higher efficiency and repeatability, which can improve the level of quality control on the production line.

References

  1. Xue Lin, Zhang Dejian, He Qun, Ma Kai, Xu Jialong. Part size measurement method based on industrial CT images [J]. Nondestructive Testing, 2023, 45(7): 16-19+60.Google ScholarGoogle Scholar
  2. Cui Wei, Wu Yimeng, Cao Fukai. Industrial CT image feature extraction of alloy cracks in aircraft body [J]. Ordnance Materials Science and Engineering, 2022, 45(4): 115-119.Google ScholarGoogle Scholar
  3. Lu Jian, Luan Chuanbin, Zhang Xiuying, Cai Yufang. Industrial CT image measurement method of precision parts [J]. Nondestructive Testing, 2022, 44(4): 28-34+54.Google ScholarGoogle Scholar
  4. Wang Fuquan, Xia Dezhi, Wen Hao. Internal defect detection of castings based on industrial CT images [J]. Shanghai Metrology and Testing, 2022, 49(3): 17-21.Google ScholarGoogle Scholar
  5. Xu Xuehui. Intelligent determination method of rigid body slice thickness based on industrial CT images [J]. Ordnance Materials Science and Engineering, 2020, 43(6): 129-132.Google ScholarGoogle Scholar
  6. Shan H, Padole A, Homayounieh F, Competitive performance of a modularized deep neural network compared to commercial algorithms for low-dose CT image reconstruction [J]. Nature Machine Intelligence, 2019, 1(6): 269-276.Google ScholarGoogle ScholarCross RefCross Ref
  7. Zhao Z. Review of non-destruCTive testing methods for defeCT deteCTion of ceramics[J]. Ceramics International, 2021, 47(4): 4389-4397.Google ScholarGoogle ScholarCross RefCross Ref
  8. Samei E, Bakalyar D, Boedeker K L, Performance evaluation of computed tomography systems: summary of AAPM Task Group 233 [J]. Medical physics, 2019, 46(11): e735-e756.Google ScholarGoogle ScholarCross RefCross Ref
  9. KłosowsKi G, Rymarczyk T, Kania K, Maintenance of industrial reaCTors supported by deep learning driven ultrasound tomography[J]. Eksploatacja i Niezawodność, 2020, 22(1): 138-147.Google ScholarGoogle Scholar
  10. Ren Z, Fang F, Yan N, State of the art in defeCT deteCTion based on machine vision[J]. International Journal of Precision Engineering and ManufaCTuring-Green Technology, 2022, 9(2): 661-691.Google ScholarGoogle ScholarCross RefCross Ref
  11. Niu S, Li B, Wang X, DefeCT image sample generation with GAN for improving defeCT recognition [J]. IEEE TransaCTions on Automation Science and Engineering, 2020, 17(3): 1611-1622.Google ScholarGoogle Scholar
  12. Mitterreiter E, Schuler B, Cochrane K A, Atomistic positioning of defeCTs in helium ion treated single-layer MoS2[J]. Nano letters, 2020, 20(6): 4437-4444.Google ScholarGoogle Scholar
  13. Luo Q, Fang X, Liu L, Automated visual defeCT deteCTion for flat steel surface: A survey[J]. IEEE TransaCTions on Instrumentation and Measurement, 2020, 69(3): 626-644.Google ScholarGoogle ScholarCross RefCross Ref
  14. He Y, Song K, Meng Q, An end-to-end steel surface defeCT deteCTion approach via fusing multiple hierarchical features [J]. IEEE transaCTions on instrumentation and measurement, 2019, 69(4): 1493-1504.Google ScholarGoogle Scholar
  15. Dong H, Song K, He Y, PGA-Net: Pyramid feature fusion and global context attention network for automated surface defeCT detection [J]. IEEE TransaCTions on Industrial Informatics, 2019, 16(12): 7448-7458.Google ScholarGoogle ScholarCross RefCross Ref
  16. Wu Y, Cao H, Yang G, Digital twin of intelligent small surface defeCT deteCTion with cyber-manufaCTuring systems[J]. ACM TransaCTions on Internet Technology, 2023, 23(4): 1-20.Google ScholarGoogle ScholarDigital LibraryDigital Library
  17. Baumgartl H, Tomas J, Buettner R, A deep learning-based model for defeCT deteCTion in laser-powder bed fusion using in-situ thermographic monitoring[J]. Progress in Additive ManufaCTuring, 2020, 5(3): 277-285.Google ScholarGoogle ScholarCross RefCross Ref
  18. Tabernik D, Šela S, Skvarč J, Segmentation-based deep-learning approach for surface-defeCT deteCTion[J]. Journal of Intelligent ManufaCTuring, 2020, 31(3): 759-776.Google ScholarGoogle ScholarCross RefCross Ref
  19. Ding R, Dai L, Li G, TDD‐net: a tiny defeCT deteCTion network for printed circuit boards[J]. CAAI TransaCTions on Intelligence Technology, 2019, 4(2): 110-116.Google ScholarGoogle ScholarDigital LibraryDigital Library
  20. Sun J, Li C, Wu X J, An effeCTive method of weld defeCT deteCTion and classification based on machine vision[J]. IEEE TransaCTions on Industrial Informatics, 2019, 15(12): 6322-6333.Google ScholarGoogle ScholarCross RefCross Ref

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      SPCNC '23: Proceedings of the 2nd International Conference on Signal Processing, Computer Networks and Communications
      December 2023
      435 pages
      ISBN:9798400716430
      DOI:10.1145/3654446

      Copyright © 2023 ACM

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      Publication History

      • Published: 3 May 2024

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